AMMS-100 XRF Ambient metal analyzer

Manufacturer

Focused Photonics (FPI)

Part Number / Code

AMMS-100

Monitored Parameter

Particulate matter (PM)

Metals

Application

Air quality

The FPI AMMS-100 monitor uses, simultaneously, beta-ray attenuation technology to monitor the concentration of suspended particles in the atmosphere and X-ray fluorescence (XRF) to analyze the constituent metals of these particles. The system performs automatically and in real time non-destructive qualitative and quantitative analyzes of the particulate material and its constituents, such as mercury (Hg), lead (Pb), cadmium (Cd), chromium (Cr) and 30 other metallic elements contained in the dust in suspension in ambient air.

Quali-quantitative particulate matter measurements associated with meteorological conditions make it possible to track the contribution of specific polluting sources, through the identification of tracers and application of receptor models. In addition, it enables the continuous monitoring of dust toxicity in urban and industrial environments.

AMMS-100 technical specifications